ALEXANDRIA, Va., Jan. 28 -- United States Patent no. 12,533,489, issued on Jan. 27, was assigned to Biosense Webster (Israel) Ltd. (Yokneam, Israel). "Measuring tissue proximity for multi-electrode c... Read More
ALEXANDRIA, Va., Jan. 28 -- United States Patent no. 12,536,138, issued on Jan. 27, was assigned to Dell Products LP (Round Rock, Texas). "File system redirector service in a scale out data protectio... Read More
ALEXANDRIA, Va., Jan. 28 -- United States Patent no. 12,536,714, issued on Jan. 27, was assigned to OLEDWorks LLC (Rochester, N.Y.). "Display with three regions of color space" was invented by John H... Read More
ALEXANDRIA, Va., Jan. 28 -- United States Patent no. 12,533,199, issued on Jan. 27. "Dental robot helmet" was invented by Martin Lyubomirov Tomov (Decatur, Ga.) and Lubomir Tomov (Sofia, Bulgaria). ... Read More
ALEXANDRIA, Va., Jan. 28 -- United States Patent no. 12,534,479, issued on Jan. 27, was assigned to Findcure Biosciences (Zhongshan) Co. Ltd. (Zhongshan, China). "Triazine compound and composition an... Read More
ALEXANDRIA, Va., Jan. 28 -- United States Patent no. 12,536,287, issued on Jan. 27, was assigned to OPEN TEXT INC. (Menlo Park, Calif.). "Real-time JavaScript classifier" was invented by Mauritius A.... Read More
ALEXANDRIA, Va., Jan. 28 -- United States Patent no. D1,110,165, issued on Jan. 27, was assigned to RB Distribution Inc. (Colmar, Pa.). "Clamp" was invented by Emmanuel A. Okereke (Ewing, N.J.). The... Read More
ALEXANDRIA, Va., Jan. 28 -- United States Patent no. 12,536,653, issued on Jan. 27, was assigned to THALES (Courbevoie, France). "Method for processing a radiological image" was invented by Fernando ... Read More
ALEXANDRIA, Va., Jan. 28 -- United States Patent no. 12,536,131, issued on Jan. 27, was assigned to Tesla Inc. (Austin, Texas). "Vector computational unit" was invented by Debjit Das Sarma (San Jose,... Read More
ALEXANDRIA, Va., Jan. 28 -- United States Patent no. 12,535,367, issued on Jan. 27, was assigned to RENESAS ELECTRONICS Corp. (Tokyo). "Semiconductor device and temperature characteristic test method... Read More